Write Amplification Factor (WAF) is a critical phenomenon in NAND flash devices that directly impacts SSD endurance, performance, and lifespan. In simple terms, lower WAF is always better, as it…
HTOL Testing: Fast-Tracking Reliability for Real-World Deployment Reliability doesn’t magically appear once a product reaches customers. It must be demonstrated and validated well before launch. One of the most effective…
Have you ever stored data, checked it again five years later, and found it still intact? That isn’t magic — it’s the science of data retention. Curious how it works?…
ECRC (End-to-End CRC) and LCRC (Link CRC) are commonly used terms in the context of PCIe. While they are sometimes mentioned together, surprisingly they are not same, it's important to…
Understanding Thermal Throttling in Storage Devices Have you ever touched a storage device—like an SSD or USB drive—while transferring a large amount of data and noticed it getting hot, even…
When purchasing a memory product based on NAND flash, you may have encountered terms like SLC, MLC, or TLC in the product description. But have you ever wondered what they…
Here I will talk about how we can use FIO (Flexible IO tester) to benchmark the performance of different types of storage devices. For the demonstration below an M.2 NVME…
Have you ever wondered what happens when a storage device, such as a memory card, overheats? This phenomenon, known as thermal throttling, can impact the host device (like a camera)…
We might have heard about queues in Nvme often. In fact whenever we hear Nvme, the word queues is bound to come with it since nothing is complete in the…
You may have come across terms like NVMe and PCIe used together, such as NVMe over PCIe. The connection between them might spark curiosity, leading to questions about their interrelation.…