Write Amplification Factor (WAF) is a critical phenomenon in NAND flash devices that directly impacts SSD endurance, performance, and lifespan. In simple terms, lower WAF is always better, as it…
HTOL Testing: Fast-Tracking Reliability for Real-World Deployment Reliability doesn’t magically appear once a product reaches customers. It must be demonstrated and validated well before launch. One of the most effective…
ECRC (End-to-End CRC) and LCRC (Link CRC) are commonly used terms in the context of PCIe. While they are sometimes mentioned together, surprisingly they are not same, it's important to…
When purchasing a memory product based on NAND flash, you may have encountered terms like SLC, MLC, or TLC in the product description. But have you ever wondered what they…
Here I will talk about how we can use FIO (Flexible IO tester) to benchmark the performance of different types of storage devices. For the demonstration below an M.2 NVME…
We might have heard about queues in Nvme often. In fact whenever we hear Nvme, the word queues is bound to come with it since nothing is complete in the…
You may have come across terms like NVMe and PCIe used together, such as NVMe over PCIe. The connection between them might spark curiosity, leading to questions about their interrelation.…
This blog will go over some background about the power states which NVME defines under the power management capabilities that allows the host to control the power of the NVM…
We often hear “Stay healthy ”, the more healthy you are, the more happy you will be and will be able to do your day to day tasks easily, in…